Method of Manufacturing A Semiconductor Integrated Circuit Device

ABSTRACT

In forming five trenches buried with an intermediate conductive layer for connecting transfer MISFETs and driving MISFETs with vertical MISFETs formed thereover, in which the second and third trenches, and the first, fourth, and fifth trenches are formed separately by twice etching using first and second photoresist films as a mask. Since all the trenches can be formed at a good accuracy even in a case where the shortest distance between the first trench and the second or third trench, and the shortest distance between the second or third trench and the fourth trench is smaller than the resolution limit for the exposure light, the distance between each of the five trenches arranged in one identical memory cell can be reduced to be smaller than resolution limit for the exposure light.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation application of U.S. application ofU.S. application Ser. No. 11/265,292, filed Nov. 3, 2005, which is acontinuation application of U.S. application Ser. No. 10/855,598, filedMay 28, 2004, which claims priority from Japanese Patent Application No.JP 2003-153882 filed on May 30, 2003, the contents of each of which arehereby incorporated by reference into this application.

BACKGROUND OF THE INVENTION

The present invention concerns a technique for use in the manufacture ofa semiconductor integrated circuit device; and, more in particular, itrelates to a technique that is effective when applied to a step offorming, in an identical interconnection layer on a semiconductorsubstrate, plural interconnections at a narrow distance, which distanceis smaller than the resolution limit for the exposure light used in aphotolithography step employed in semiconductor manufacture.

Along with refinement of semiconductor integrated circuits, since thepattern size, for example, of electrode interconnections formed oversemiconductor substrates have already reached the resolution limit ofthe exposure light used in the photolithographic step employed insemiconductor manufacture, a phase shift technique or a multipleexposure technique, which is capable of forming such interconnections ata pattern size smaller than the resolution limit of the exposure light,have been adopted.

The multiple exposure technique is a technique in which exposure isrepeated plural times using plural sheets of photomasks, therebytransferring a pattern with a size smaller than the resolution limit ofthe exposure light to a photoresist film on a semiconductor substrate,as disclosed, for example, in the below-listed Patent Documents 1 to 3.

For example, Patent Document 1 discloses a quadplex exposure techniqueof conducting duplicate exposure to a photoresist film by using firstand second photomasks, with the positions for a shield pattern and aphase shift pattern being replaced with each other, and then conductingexposure to the photoresist film by using third and fourth photomasks,with the positions for the patterns being different from those of thefirst and second photomasks and the positions for the shield pattern andthe phase shift pattern being replaced with each other, therebytransferring a pattern at a size smaller than the resolution limit ofthe exposure light.

[Patent Document 1]

Japanese Patent Application laid-open No. Hei 8 (1996)-45834

[Patent Document 2]

Japanese Patent Application laid-open No. 2002-134394

[Patent Document 3]

Japanese Patent Application laid-open No. 2002-258462

SUMMARY OF THE INVENTION

The multiple exposure technique of conducting exposure plural times withregard to an identical photoresist film using plural sheets ofphotomasks involves a problem in that the transfer accuracy of thepattern is lowered as the distance between each of the patternstransferred to the photoresist film becomes finer due to the effect ofinterference between lights with each other in the plural exposures.That is, the existent multiple exposure technique can refine theindividual patterns so that they are smaller than the resolution limitof the exposure light, but it can not refine the distance between eachof the patterns to a value smaller than the resolution limit of theexposure light.

For example, in a SRAM (Static Random Access Memory) that is underdevelopment by the present inventors, among six MISFETs (Metal InsulatorSemiconductor Field Effect Transistor) constituting a memory cell, twoMISFETs are constituted as a vertical structure, and the two verticalMISFETs are arranged over the remaining four MISFETs, thereby decreasingthe memory cell size.

In the SRAM described above, eight local interconnections, referred toas an intermediate conductive layer by the present inventors, are formedto one identical interconnection layer in the memory cell, and a MISFETin the lower layer and a MISFET in the upper layer are connected by wayof a portion of the intermediate conductive layer.

For an SRAM having the structure described above, it is required todecrease the distance between each of the eight local interconnectionsformed over one identical layer to a value smaller than the resolutionlimit of the exposure light if the size of the memory cell is to bedecreased. However, the distance between each of the localinterconnections can not be decreased to a value smaller than theresolution limit of the exposure light by using the existent multipleexposure technique.

It is an object of present invention to provide a technique that iscapable of reducing the memory size of an SRAM, thereby promoting anincrease in the integration degree.

It is a further object of the present invention to provide a techniquethat is capable of promoting refinement and achieving an increase in theintegration degree of an LSI by reducing the distance between each ofplural interconnections formed over one identical interconnection layeron a semiconductor substrate and of reducing the distance between eachof plural through holes formed in one identical insulating film.

The foregoing and other objects and novel features of the presentinvention will become more apparent with reference to the descriptionsprovided in the present specification and the appended drawings.

Typical examples disclosed in the present application are describedgenerally below.

A method of manufacturing a semiconductor integrated circuit device forforming plural interconnections in one identical interconnection layeron a semiconductor substrate according to the present inventioncomprises the steps of:

(a) dividing the plural interconnections into plural groups, andproviding plural sheets of photomasks formed with an interconnectionpattern contained in each of the plural groups; and(b) forming the plural interconnections by photolithographic stepsplural times by using the plural sheets of photomasks.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an equivalent circuit diagram of a memory cell of SRAM whichrepresents a preferred embodiment of the invention;

FIG. 2 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 3 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred according to theinvention;

FIG. 4 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 5 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 6 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 7 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 8 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 9 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 10 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 11 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 12 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 13 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 14 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 15 is a cross sectional view taken along line D-D′ in FIG. 14;

FIG. 16 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 17 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 18 is a plan view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 19 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 20 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 21 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 22 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 23 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 24 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 25 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 26 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 27 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the preferred embodiment according tothe invention;

FIG. 28 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing a second preferred embodimentaccording to the invention;

FIG. 29 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 30 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 31 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 32 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 33 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 34 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 35 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 36 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the second preferred embodimentaccording to the invention;

FIG. 37 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing a third preferred embodimentaccording to the invention;

FIG. 38 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the third preferred embodimentaccording to the invention;

FIG. 39 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM as representing the third preferred embodimentaccording to the invention;

FIG. 40 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the third preferred embodimentaccording to the invention;

FIG. 41 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the third preferred embodimentaccording to the invention;

FIG. 42 is a cross sectional view of a main portion showing a method ofmanufacturing an SRAM representing the third preferred embodimentaccording to the invention;

FIG. 43 is a schematic plan view showing a circuit block for a memoryhybridized logic device representing a fourth preferred embodiment ofthe invention:

FIG. 44 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth embodiment of theinvention;

FIG. 45 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 46 is a cross sectional view taken along line E-E′ in FIG. 45showing a method of forming interconnections representing the fourthembodiment of the invention;

FIG. 47 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 48 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth embodiment of theinvention;

FIG. 49 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 50 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth embodiment of theinvention;

FIG. 51 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 52 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth embodiment of theinvention;

FIG. 53 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 54 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 55 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 56 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth embodiment of theinvention;

FIG. 57 (a) is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 57( b) is a cross sectional view taken along line F-F′ in FIG. 57(a) showing a method of forming interconnections representing the fourthembodiment of the invention;

FIG. 58 (a) is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 58( b) is a cross sectional view of a main portion showing a methodof forming interconnections representing the fourth embodiment of theinvention;

FIG. 59 (a) is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;

FIG. 59( b) is a cross sectional view of a main portion showing a methodof forming interconnections representing the fourth embodiment of theinvention;

FIG. 60 is a plan view of a main portion showing a method of forminginterconnections representing the fourth embodiment of the invention;and

FIG. 61 is a cross sectional view of a main portion showing a method offorming interconnections representing the fourth as other embodiment ofthe invention.

PREFERRED EMBODIMENTS OF THE INVENTION

The present invention will be described more specifically by way ofpreferred embodiments with reference to the drawings. Throughout thedrawings, those components having identical functions carry will beidentified by the same reference numerals, and duplicate descriptionsthereof will be omitted.

Preferred Embodiment 1

FIG. 1 is an equivalent circuit diagram of a memory cell of an SRAMrepresenting a preferred embodiment according to the present invention.The memory cell (MC) of the SRAM comprises two transfer MISFETs (TR₁,TR₂), two driving MISFETs (DR₁, DR₂), and two vertical MISFETs (SV₁,SV₂) each arranged at the intersection between a pair of complementarydata lines (BLT, BLB) and a word line (WL).

Among the six MISFETs constituting the memory cell (MC), the twotransfer MISFETs (TR₁, TR₂) and two driving MISFETs (DR₁, DR₂) areconstituted each as an n-channel type MISFET. Further, the two verticalMISFETs (SV₁, SV₂) are constituted as with a p-channel type MISFET. Thevertical MISFETs (SV₁, SV₂) correspond to a load MISFET in the wellknown complete CMOS type SRAM, but, as opposed to the usual load MISFET,it is constituted to have a vertical structure, as will be describedbelow, and is formed over regions forming the MISFETs (DR₁, DR₂) and thetransfer MISFETs (TR₁, TR₂).

In the memory cell (MC), the driving MISFET (DR₁) and the verticalMISFET (SV₁) constitute a first inverter INV₁, and the driving MISFET(DR₂) and the vertical MISFET (SV₂) constitute a second inverter INV₂.The pair of inverters INV₁ and INV₂ are cross coupled in the memory cell(MC) to constitute a flip-flop circuit, which serves as a memoryaccumulating portion for storing one bit of information.

That is, the drain of the driving MISFET (DR₁), the drain of thevertical MISFET (SV₁), the gate of the driving MISFET (DR₂) and the gateof the vertical MISFET (SV₂) are electrically connected to each other,to constitute one accumulation node (A) of the memory cell. The drain ofthe driving MISFET (DR₂), the drain of the vertical MISFET (SV₂), thegate of the driving MISFET (DR₁), and the gate of the vertical MISFET(SV₁) are electrically connected to each other, to constitute the otheraccumulation node (B) of the memory cell.

One input/output terminal of the flip-flop circuit is electricallyconnected to one of the source and the drain of the transfer MISFET(TR₁) and the other input/output terminal thereof is connectedelectrically to one of the source and the drain of the transfer MISFET(TR₂). The other of the source and the drain of the MISFET (TR₁) iselectrically connected to one data line (BLT) in the pair ofcomplementary data lines, while the other of the source and the drain ofthe transfer MISFET (TR₂) is electrically connected to the other dataline (BLB) in the pair of complementary data lines. Further, one end ofthe flip-flop circuit, that is, the source of the two vertical MISFETs(SV₁, SV₂) is electrically connected to a power supply voltage line(Vdd) for supplying a power supply voltage (Vdd) at a higher potentialthan the reference voltage (Vss), for example, 3 V, and the other endthereof, that is, the sources of the two driving MISFETs (DR₁, DR₂) areelectrically connected to a reference voltage line (Vss) for supplying areference voltage (Vss), for example, 0 V. The gate electrodes of thetransfer MISFETs (TR₁, TR₂) are electrically connected to the word line(WL). The memory cell (MC) stores information by putting one of the pairof accumulation nodes (A, B) to a High level and the other to a Lowlevel.

The information storing, reading and writing operations in the memorycell (MC) are basically identical with those of the known complete CMOStype SRAM. That is, upon reading the information, for example, the powersupply voltage (Vdd) is applied to a selected word line (WL) to turn thetransfer MISFETs (TR₁, TR₂) ON and the potential difference between thepair of accumulation nodes (A, B) is read on the complementary datalines (BLT, BLB). Further, upon writing information, for example, thepower supply voltage (Vdd) is applied to a selected word line (WL) toturn the transfer MISFETs (TR₁, TR₂) ON and one of the complementarydata lines (BLT, BLB) is connected with the power supply voltage (Vdd)and the other of them is connected with the reference voltage (Vss)thereby turning the driving MISFETs (DR₁, DR₂) ON and OFF.

The SRAM of this embodiment is constituted with a memory array in whichthe plural memory cells are formed and a periphery circuit formed at theperipheral of the memory array. The peripheral circuit for the SRAMincludes, for example, an X decoder circuit, a Y decoder circuit, asense amplifier circuit, an input/output circuit and a logic circuiteach constituted with an n-channel type MISFET and a p-channel typeMISFET.

A method of manufacturing the SRAM described above will be describedwith reference to FIG. 2 to FIG. 27. Those portions carrying referencesA, A′ are cross sectional views taken along line A-A′ in FIG. 2 (planview for memory array), those portions carrying references B, B′ arecross sectional views taken along line B-B′ in FIG. 2, those portionscarrying references C, C′ are cross sectional views taken along lineC-C′ in FIG. 2, and other portions are cross sectional views showingportions of the peripheral circuit (P-channel type MISFET formingregion). Further, each of the plan views which illustrate the method ofmanufacturing the SRAM (plan view for memory array) shows only the mainconductive layers and their connection regions constituting the memorycell, but does not show an insulating film and the like formed betweenthe conductive layers. Further, in each of the plan views, a squareregion surrounded by four symbols (+) shows an occupation region of anmemory cell.

At first, as shown in FIG. 2 and FIG. 3, a device isolation trench 2 isformed to a device isolation region on the main surface of a substrate 1comprising, for example, p-single crystal silicon. The device isolationtrench 2 is formed, for example, by forming a trench by dry etching themain surface of the substrate 1, successively depositing an insulatingfilm such as a silicon oxide film 3 on the substrate 1 including theinside of the trench by a CVD process and then polishing and removing anunnecessary silicon oxide film 3 outside the trench by a chemicalmechanical polishing (CMP) method thereby leaving the silicon oxide film3 inside the trench. By forming the device isolation trench 2, an islandactive region (L) defined at the periphery with the device isolationtrench 2 is formed to the main surface of the substrate 1 for the memoryarray.

Then, after ion implanting phosphorus (P) to a portion and ionimplanting boron (B) to the other portion of the substrate 1, forexample, the substrate 1 is subjected to a heat treatment to diffuse theimpurities into the substrate 1 thereby forming a p-well 4 and a n-well5 on the main surface of the substrate 1. As shown in the drawings, onlythe p-well 4 is formed but the n-well 5 is not formed to the substrate 1for the memory array. On the other hand, the n-well 5 and a notillustrated p-well are formed to the substrate 1 for the peripheralcircuit region.

Then, the substrate 1 is thermally oxidized to form a gate insulatingfilm 6 comprising, for example, silicon oxide to the respective surfacesof the p-well 4 and the n-well 5.

Then, as shown in FIG. 4 and FIG. 5, gate electrodes 7A and 7Bcomprising, for example, an n-polycrystal silicon film are formed asconductive films on the p-well 4 of the memory array, and a gateelectrode 7C comprising, for example, a p-polycrystal silicon film isformed as a conductive film on the n-well 5 in the peripheral circuitregion. Although not illustrated, a gate electrode comprising, forexample, an n-polycrystal silicon film is formed as a conductive film onthe p-well in the peripheral circuit region.

The gate electrode 7A formed to the memory array constitutes a gateelectrode for the transfer MISFETs (TR₁, TR₂), and the gate electrode 7Bconstitutes the gate electrode for the driving MISFETs (DR₁, DR₂).Further, the gate electrode 7C formed in the peripheral circuit regionconstitutes the gate electrode for the p-channel type MISFET in theperipheral circuit. As shown in FIG. 4, each of the gate electrodes 7Aand 7B formed to the memory array has a rectangular planar patternextending in the direction X of the drawing.

The gate electrodes 7A, 7B and 7C are formed, for example, by forming ann-polycrystal silicon film on the gate insulating film 6 of the p-well4, forming a p-polycrystal silicon film on the gate insulating film 6 ofthe n-well 5, and then depositing a silicon oxide film 8 as a capinsulating film over each of the n-polycrystal silicon film and thep-polycrystal silicon film, for example, by a CVD process. Then-polycrystal silicon film and the p-polycrystal silicon film areformed, for example, by depositing a non-doped polycrystal silicon film(or amorphous silicon film) over the gate insulating film 6 by a CVDprocess and then ion implanting phosphorus (or arsenic) to thepolycrystal silicon film (or amorphous silicon film) over the p-well 4and ion implanting boron into the non-doped polycrystal silicon film (oramorphous silicon film) over the n-well 5.

Then, the silicon oxide film 8 is patterned so as to be in a planarshape identical with the gate electrodes 7A, 7B and 7C by dry etchingusing a photoresist film as a mask and, successively, the n-polycrystalsilicon film and the p-polycrystal silicon film are dry etched by usingthe patterned silicon oxide film 8 as a mask.

Then, as shown in FIG. 6, n-impurities (phosphorus or arsenic) are ionimplanted, for example, to the p-well 4, thereby forming ann⁻-semiconductor region 9 at a relatively low concentration andp-impurities (boron) are ion implanted into the n-well 5 thereby forminga p⁻-semiconductor region 10 at a relatively low concentration. Then⁻-semiconductor region 9 is formed for providing an LDD (Lightly DopedStructure) for the source and the drain of each of the transfer MISFETs(TR₁, TR₂), the driving MISFETs (DR₁, DR₂), and the N-channel typeMISFET in the peripheral circuit, and the p⁻-semiconductor region 10 isformed for providing the LDD structure for the source and the drain ofthe p-channel MISFET in the peripheral circuit.

Then, a side wall spacer 13 comprising an insulating film is formed tothe side wall for each of the gate electrodes 7A, 7B, 7C. The side wallspacer 13 is formed, for example, by depositing a silicon oxide film anda silicon nitride film over the substrate 1 by a CVD process and thenanisotropically etching the silicon nitride film and the silicon oxidefilm. In this step, the silicon oxide film 8 covering the upper surfacefor each of the gate electrodes 7A, 7B and 7C, and the silicon oxidefilm (gate insulating film 6) over the surface of the substrate 1 areetched, thereby exposing the surface of each of the gate electrodes 7A,7B, and 7C and the surface for each of the n⁻-semiconductor region 9 andthe p⁻-semiconductor region 10.

Then, as shown in FIG. 7, n-impurities (phosphorus or arsenic) are ionimplanted into the p-well 4 to form an n⁺-semiconductor region 14 at arelatively high concentration, and p-impurities (boron) are ionimplanted into the n-well 5 to form a p⁺-semiconductor region 15 at arelatively high concentration. The n⁺-semiconductor region 14 formed inthe p-well 4 of the memory array constitutes the source and the drainfor each of the transfer MISFETs (TR₁, TR₂) and the driving MISFETs(DR₁, DR₂), and the p⁺-semiconductor region 15 formed in the n-well 5 ofthe peripheral circuit region constitutes the source and the drain ofthe p-channel MISFET. Phosphorus or arsenic are ion implanted asn-impurities into the not-illustrated p-well in the peripheral circuitregion, to form an n⁺-semiconductor region at a relatively highconcentration constituting the source and the drain of the n-channeltype MISFET.

Then, a Co silicide layer 18 is formed to the surface of the gateelectrodes 7A, 7B, and 7C, and the surface of the source and the drain(n⁺-semiconductor region 14, p⁺-semiconductor region 15) respectively.The Co silicide layer 18 is formed, for example, by depositing a cobalt(Co) film over the substrate 1 by a sputtering method, successivelyapplying a heat treatment to the substrate 1 to cause silicide reactionat the boundary between the Co film and the gate electrodes 7A, 7B, and7C and at the boundary between the Co film and the substrate 1 and thenetching to remove an unreacted Co film. By the steps described so far,the n-channel type transfer MISFETs (TR₁, TR₂) and the driving MISFETs(DR₁, DR₂) are formed in the memory array and p-channel type MISFETs(Qp) and the not illustrated n-channel type MISFET are formed in theperipheral circuit region.

As shown in FIG. 8, the transfer MISFET (TR₁) and the driving MISFET(DR₁) on one side and the transfer MISFET (TR₂) and the driving MISFET(DR₂) on the other side are isolated in the lateral direction (directionX) as seen in the drawing by way of the device isolation portion andthey are arranged in a point-to-point symmetry with respect to thecenter for the memory cell forming region. Further, the gate electrodes7B for the driving MISFET (DR₂) and the driving MISFET (DR₁) arearranged so as to extend in the lateral direction (direction X) as seenin the drawing, and each one end thereof is terminated above the deviceisolation portion between the transfer MISFET (TR₁) and the drivingMISFET (DR₁) on one side and the transfer MISFET (TR₂) and the drivingMISFET (DR₂) on the other side, and the vertical MISFETs (SV₁, SV₂) tobe described later are formed above the one end.

Then, as shown in FIG. 9 and FIG. 10, a silicon nitride film 19 and asilicon oxide film 20 are deposited, for example, by a CVD process asinsulating films covering the MISFETs (TR₁, TR₂, DR₁, DR₂, Qp) and,successively, the surface of the silicon film 20 is planarized by achemical polishing method.

Then, the silicon oxide film 20 and the silicon nitride film 19 are dryetched by using a photoresist film as a mask, thereby forming a contacthole 21 over the gate electrode 7B of the driving MISFETs (DR₁, DR₂),and contact holes 22 over the gate electrodes 7B of the transfer MISFETs(TR₁, TR₂). Further, contact holes 23, 24, and 25 are formed over thesource and the drain (n⁺-semiconductor region 14) of the transferMISFETs (TR₁, TR₂) and the driving MISFETs (DR₁, DR₂) respectively, andcontact holes 26 and 27 are formed over the gate electrode 7C and thesource and the drain (p⁺-semiconductor region 15) of the p-channel typeMISFET (Qp) in the peripheral circuit region.

Then, as shown in FIG. 11, after forming a plug 28 inside the contactholes 21 to 27, a silicon nitride film 29 and a silicon oxide film 30are deposited over the substrate 1 by a CVD process. The plug 28 isformed, for example, by depositing a titanium (Ti) film and a titaniumnitride (TiN) film on the silicon oxide film 20 including the inside ofthe contact holes 21 to 27 by a sputtering method, successivelydepositing a TiN film and a tungsten (W) film as a metal film by a CVDprocess and then removing the W film, TiN film, and Ti film outside thecontact holes 21 to 27 by a chemical mechanical polishing method. Thesilicon nitride film 29 under the silicon oxide film 30 is used as astopper film upon etching the silicon oxide film 30 in the next step.

Then, as shown in FIG. 12 and FIG. 13, the silicon nitride film 29 andthe silicon oxide film 30 are dry etched by using a photoresist film asa mask thereby forming trenches 31 to 37 over the contact holes 21 to27, respectively. Among the trenches 31 to 37, each of the trenches 32and 33 formed in the memory array respectively has a planar patternextending from one to the other of the contact holes 22 and 23.

Further, among the trenches 31 to 35 formed to the memory array, theshortest distance (Da) between the trench 31 and the trench 32, and theshortest distance (Da) between the trench 31 and trench 33 shown in FIG.12 is, for example, 0.14 μm and the shortest distance (Db) and theshortest distance (Db) between the trench 33 and the trench 34 is, forexample, 0.11 μm.

In this case, when the patterns for the trenches 31 to 37 are intendedto be transferred to the photoresist film by using an exposure apparatususing, as a light source, KrF (krypton fluoride) at a wavelength of0.193 μm for instance, since each of the shortest distance (Da) or (Db)is smaller than the resolution limit for the exposure light, the patternfor the trench 31 and the pattern for the trench 32 or 33, as well asthe pattern for the trench 32 or 33 and the pattern for the trench 34are connected, not isolated from each other by the interference betweenthe exposure lights. That is, in this case, the trenches 31 to 34 cannot be isolated from each other. In view of the above, the trenches 31to 37 are formed in this embodiment by using the following method.

FIG. 14 is a plan view of a memory array in the stage of depositing thesilicon nitride film 29 and the silicon oxide film 30 over the substrate1 (step shown in FIG. 11) which shows the region including about fourmemory cells. Further, FIG. 15 is a cross sectional view taken alongline D-D′ in FIG. 14.

As shown in FIG. 16 and FIG. 17, a first photoresist film 38 is formedover the silicon oxide film 30, and the silicon oxide film 30 and thesilicon nitride film 29 are dry etched by using the photoresist film 38as a mask, thereby forming a portion for the trenches 31 to 35, forexample, the trench 32 and the trench 33. That is, in this step, thepatterns for the trenches 32 and 33 are transferred to the photoresistfilm 38 by using the first photomask (not illustrated) formed with thepatterns for the trenches 32 and 33 and then the trenches 32 and 33 areformed to the silicon oxide film 30 and the silicon oxide nitride film29 by dry etching using the photoresist film 38 as a mask.

With such a constitution, since the distance between the two trenches 32and 33 is larger than the resolution limit for the exposure light (0.193μm in a case of using KrF as a light source) even at the shortestportion, the patterns for the trenches 32 and 33 can be transferred at agood accuracy to the photoresist film 38 and, accordingly, trenches 32and 33 can be formed at a good accuracy to the silicon oxide film 30 andthe silicon nitride film 29.

Then, after removing the photoresist film 38, as shown in FIG. 18 andFIG. 19, a second photoresist film 39 is formed over the silicon oxidefilm 30, and the silicon oxide film 30 and the silicon nitride film 29are dry etched by using the photoresist film 39 as a mask therebyforming, for example, a trench 31, a trench 34 and a trench 35. That is,in this step, patterns for the trenches 31, 34, and 35 are transferredto the photoresist film 39 by using a second photomask (not illustrated)formed with the patterns for the trenches 31, 34, and the 35 and thenthe trenches 31, 34, and the 35 are formed to the silicon oxide film 30and the silicon nitride film 29 by dry etching using the photoresist 39as a mask. With such a constitution, since the distance between each ofthe trenches 31, 34, and 35 is larger than the resolution limit for theexposure light even at the shortest portion, the patterns for thetrenches 31, 34, and 35 can be transferred at a good accuracy to thephotoresist film 39 and, accordingly, the trenches 31, 34, and 35 can beformed at a good accuracy to the silicon oxide film 30 and the siliconnitride film 29.

As described above, in this embodiment, in a case of forming thetrenches 31 to 35 each at a distance closer to each other in oneidentical memory cell, the trenches 32 and 33 are at first formed byusing the first photoresist film 38 transferred with the patterns forthe two trenches 32 and 33 at a distance between them which is largerthan the resolution limit for the exposure light, then the trenches 31,34, and 35 are formed by using the second photoresist film 39transferred with the patterns for the three trenches 31,34, and 35 withthe distance between each of them being larger than the resolution limitto the exposure light. Alternatively, the trenches 31, 34, and 35 may beformed at first by using the photoresist film 39 and then the trenches32 and 33 may be formed by using the photoresist film 38.

With the constitution described above, even in a case where the shortestdistance (Da) between the trench 31, and the trench 32 or 33 or theshortest distance (Db) between the trench 32 or 33 and the trench 34 issmaller than the resolution limit for the exposure light, among thetrenches 31 to 35 formed in one identical memory cell, all the trenches31 to 35 can be formed at a good accuracy.

The trenches 36 and 37 formed in the peripheral circuit region generallyhave a larger distance between each other even in a case where they areconnected with one MISFET compared with the trenches 31 to 35 formed inthe memory array. Accordingly, the trenches 36 and 37 in the peripheralcircuit region can be formed simultaneously upon formation of thetrenches 32 and 33 in the memory array by dry etching using the firstphotoresist film 38, or upon formation of the trenches 31, 34, and 35 inthe memory array by dry etching using the second photoresist film 39 asa mask. When it is intended to make the distance between the trenches 36and 37 formed in the peripheral circuit region narrower than theresolution limit for the exposure light, this may be achieved by formingone of the trenches 36 and 37 upon forming the trenches 32 and 33 to thememory array by dry etching using the first photoresist film 38 as amask and by forming the other of the trenches 36 and 37 upon forming thetrenches 31, 34, and 35 in the memory array by dry etching using thesecond photoresist film 39 as a mask.

The trenches 31 to 35 can be formed also by the following method. Atfirst, as shown in FIG. 20, after depositing a silicon nitride film 29and a silicon oxide film 30 over a substrate 1, a silicon nitride film40 is deposited over the silicon oxide film 30. The silicon nitride film40 as the uppermost layer is used as a hard mask upon etching thesilicon oxide film 30 as the lower layer thereof.

Then, as shown in FIG. 21, after transferring patterns for the groove 32and 33 to the first photoresist film 38 formed over the silicon nitridefilm 40, the silicon nitride film 40 is dry etched by using thephotoresist film 38 as a mask.

Then, after removing the photoresist film 38, as shown in FIG. 22,patterns for the trenches 31, 34 and 35 are transferred to the secondphotoresist film 39 formed over the silicon nitride film 40, and thesilicon nitride film 40 is dry etched by using the photoresist film 39as a mask.

As described above, the trenches 32 and 33 are formed at first to thesilicon nitride film 40 by using the first photoresist film 38transferred with the patterns for the two trenches 32 and 33 having adistance between each other larger than the resolution limit for theexposure light and then the trenches 31, 34, and 35 are formed to thesilicon nitride film 40 by using the second photoresist film 39transferred with the patterns for the three trenches 31, 34, and 35having a distance between each other larger than the resolution limitfor the exposure light. This can form the patterns for the trenches 31to 35 to the silicon nitride film 40 at a good accuracy.

Then, after removing the photoresist film 39, the silicon oxide film 30is dry etched by using the silicon nitride film 40 as a mask, as shownin FIG. 23, thereby forming trenches 31, 33 and not illustrated trenches32, 34 and 35 in the silicon oxide film 30. In this case, etching isstopped at a stage where the surface of the underlying silicon nitridefilm 29 is exposed, so that the silicon oxide film 20 below the trenches31 to 35 is not etched.

Then, as shown in FIG. 24, the silicon nitride film 40 left on thesilicon oxide film 30 outside the trenches 31 to 35 and the siliconnitride film 29 exposed to the bottom of the trenches 31 to 35 areetched simultaneously, to complete the trenches 31 to 35.

The method of forming the trenches 31 to 35 described above has anadvantage capable of transferring the patterns for the trenches 31, 34,and 35 at a high accuracy to the second photoresist film 39 since theunderlying step (step between the surface of the silicon nitride film 40and the surface of the silicon oxide film 30) is small upon forming thesecond photoresist film 39 over the silicon nitride film 40. On theother hand, in the method of forming the trenches 31 to 35 shown in FIG.16 to FIG. 19, since the underlying step (step between the surface ofthe silicon oxide film 30 and the surface of the silicon oxide film 20)is larger upon exposing the second photoresist film 39 to transfer thepatterns of the trenches 31, 34, and 35 (refer to FIG. 19), the accuracyfor transferring the patterns for the trenches 31, 34, and 35 issomewhat lowered compared with the second method.

Then, as shown in FIG. 25, intermediate conductive layers 41 to 45 areformed respectively inside the trenches 31 to 35 formed in the memoryarray and first layer interconnections 46 and 47 are formed to theinside of the trenches 36 and 37 formed in the peripheral circuit regionrespectively. The intermediate conductive layers 41 to 45 and the firstlayer interconnections 46 and 47 are formed, for example, by depositinga TiN film over the silicon oxide film 30 including the inside of thetrenches 31 to 37 by a sputtering method, successively depositing a Wfilm as a metal film by a CVD process and then removing the W film andthe TiN film outside the trenches 31 to 37 by a chemical mechanicalpolishing method.

Then, as shown in FIG. 26, a vertical MISFET (SV₁) is formed over oneend of the gate electrode 7B for the driving MISFET (DR₂) and a verticalMISFET (SV₂) is formed over one end of the gate electrode 7B for thedriving MISFET (DR₁).

The vertical MISFET (SV₁) comprises a square columnar stack (P₁) formedby stacking a lower semiconductor layer (drain) 57, an intermediatesemiconductor layer 58, and an upper semiconductor layer (source) 59,and a gate electrode 66 formed on the side wall of the stack (P₁) by wayof a gate insulating film 63. The lower semiconductor layer (drain) 57of the vertical MISFET (SV₁) is connected with the intermediateconductive layer 42 by way of a plug 55 and a barrier layer 48 formedtherebelow and, further, it is electrically connected by way of theintermediate conductive layer 42 and plugs 28 and 28 therebelow to oneof the source and the drain of the transfer MISFET (TR₁), then⁺-semiconductor region 14 as the drain of the driving MISFET (DR₁), andthe gate electrode 7B of the driving MISFET (DR₂).

The vertical MISFET (SV₂) comprises a square columnar stack (P₂) formedby stacking a lower semiconductor layer (drain) 57, an intermediatesemiconductor layer 58, and an upper semiconductor layer (source) 59,and a gate electrode 66 formed on the side wall of the stack (P₂) by wayof a gate insulating film 63. The lower semiconductor layer (drain) 57of the vertical MISFET (SV₂) is connected with the intermediateconductive layer 43 by way of a plug 55 and a barrier layer 48 formedtherebelow and, further, it is electrically connected by way of theintermediate conductive layer 43 and plugs 28 and 28 therebelow to oneof the source and the drain of the transfer MISFET (TR₂), then⁺-semiconductor region 14 as the source of the driving MISFET (DR₂),and the gate electrode 7B of the driving MISFET (DR₁).

In the vertical MISFET (SV₁, SV₂), the lower semiconductor layer 57constitutes the drain, the intermediate semiconductor layer 58constitutes the substrate (channel region), and the upper semiconductorlayer 59 constitutes the source. Each of the lower semiconductor layer57, the intermediate semiconductor layer 58, and the upper semiconductorlayer 59 is constituted with a silicon film, the lower semiconductorlayer 57 and the upper semiconductor layer 59 are p-doped andconstituted with a p-silicon film. That is, the vertical MISFET (SV₁,SV₂) are constituted each with a p-channel type MISFET formed with thesilicon film.

Then, as shown in FIG. 27, a plug 80, a power supply voltage line (Vdd)90, complementary data lines (BLT, BLB) and a second layerinterconnections 89 in the peripheral circuit are formed over thevertical MISFETs (SV₁, SV₂). The power supply voltage line (Vdd) 90, thecomplementary data lines (BLT, BLB), and the second layerinterconnection 89 are each constituted with a metal film mainlycomprising copper (Cu).

The gate electrode 66 for the vertical MISFET (SV₁) is electricallyconnected by way of the gate extension electrode 51 b, the plug 80, theintermediate conductive layer 43, and the plugs 28, 28 therebelow withone of the source and the drain for the transfer MISFET (TR₂), then⁺-semiconductor region 14 as the drain for the driving MISFET (DR₂),and the gate electrode 7B for the driving MISFET (DR₁). The gateelectrode 66 for the vertical MISFET (SV₂) is electrically connected byway of the gate extension electrode 51 a, the plug 80, the intermediateconductive layer 42, and the plugs 28, 28 therebelow with one of thesource and the drain for the transfer MISFET (TR₁), the n⁺-semiconductorregion 14 as the drain for the driving MISFET (DR₂), and the gateelectrode 7B for the driving MISFET (DR₂).

The power supply voltage line (Vdd) 90 is electrically connected withthe upper semiconductor layer (source) 59 of the vertical MISFET (SV₁)and the upper semiconductor layer (source) 59 for the vertical MISFET(SV₂).

The complementary data line BLT is electrically connected with the otherof the source and the drain (n⁺-semiconductor region 14) of the transferMISFET (TR₁) and the complementary data line (BLB) is electricallyconnected with the other of the source and the drain (n⁺-semiconductorregion 14) of the transfer MISFET (TR₂).

Not illustrated word line (WL) and reference voltage line (Vss) areformed over the power supply voltage line (Vdd) 90 and the complementarydata lines (BLT, BLB). The word line (WL) is electrically connected withthe gate electrode 7A for the transfer MISFETs (TR₁, TR₂) and thereference voltage line (Vss) is electrically connected with then⁺-semiconductor region (source) 14 for the driving MISFETs (DR₁, DR₂).The word line (WL) and the reference voltage line (Vss) are constitutedeach, for example, with a metal film mainly comprising copper (Cu).

By the steps described so far, a memory cell (MC) constituted with thetwo transfer MISFETs (TR₁, TR₂), two driving MISFETs (DR₁, DR₂), and twovertical MISFETs (SV₁, SV₂) is substantially completed. The structureand the manufacturing method for the memory cell (MC) are describedspecifically in Japanese Patent Application No. 2002-224254.

As described above, in this embodiment, upon forming the trenches 31 to35 buried with the intermediate conductive layers 41 to 45 forconnecting the transfer MISFETs (TR₁, TR₂) and the driving MISFETs (DR₁,DR₂), and the vertical MISFETs (SV₁, SV₂) formed thereover, the trenches32 and 33, and the trenches 31, 34, and 35 are formed separately bytwice etching using the first and the second photoresist films 38 and 39as the masks.

With the constitution described above, since all the trenches 31 to 35can be formed at a good accuracy even in a case where the shortestdistance (Da) between the trench 31 and the trench 32 or 33, and theshortest distance (Db) between the trench 32, 33, and the trench 34 aremade smaller than the resolution limit for the exposure light, it ispossible to reduce the distance between each of the trenches 31 to 35disposed in one identical memory cell, and the memory cell size of theSRAM can be reduced. Further, this can also increase the capacity of theSRAM or reduce the chip size of the SRAM.

According to this embodiment, the memory cell size of the SRAM can bereduced without using an expensive phase shift mask. Further,combination of the technique disclosed in this embodiment with the phaseshift technique enables further reduction of the memory cell size.

Preferred Embodiment 2

This embodiment is applied to a method of forming pluralinterconnections each at a distance smaller than the resolution limitfor the exposure lights in one identical interconnection layer.

As shown in FIG. 28, after forming a silicon oxide film 70 over asubstrate 1, a W film 71 is deposited over the silicon oxide film 70 bya sputtering method and, successively, a silicon nitride film 72 isdeposited over the W film 71. The W film 71 as the interconnectionmaterial may be replaced with another metal film such as an Al-alloyfilm. Further, the silicon nitride film 72 is used as a hard mask uponetching the interconnection material in the underlying layer thereof.

Then, as shown in FIG. 29, first photoresist films 73 a and 73 b areformed over the silicon nitride film 72, and the silicon nitride film 72is dry etched by using the photoresist films 73 a and 73 b as a maskthereby forming two hard masks 72 a and 72 b having a shape identicalwith the interconnections. In this case, the two hard marks 72 a and 72b can be formed at a good accuracy by making the distance between thetwo photoresist films 73 a and 73 b as shown in the drawing larger thanthe resolution limit for the exposure light.

Then, after removing the photoresist films 73 a and 73 b, as shown inFIG. 30, a second photoresist film 74 having the same shape as that ofinterconnections is formed between the two hard masks 72 a and 72 bremaining on the W film 71. In this case, the distance (Sa) between thesecond photoresist film 74 and the hard mask 72 a and the distance (Sb)between the second photoresist film 74 and the hard mask 72 b is smallerthan the resolution limit for the exposure light.

Then, interconnections 71A, 71B, and 71C are formed by dry etching the Wfilm 71 using the hard masks 72 a and 72 b and the photoresist film 74as a mask as shown in FIG. 31.

According to the method described above, plural interconnections 71A,71B and 71C each having a distance (Sa, Sb) smaller than the resolutionlimit for the exposure light can be formed at a good accuracy.

The interconnections 71A, 71B, and 71C can also be formed by thefollowing method. At first, as shown in FIG. 32, a W film 71 isdeposited over a silicon oxide film 70, a silicon nitride film 72 isdeposited successively over the W film 71 and then a silicon oxide film75 is deposited over the silicon nitride film 72. The silicon nitridefilm 72 and the silicon oxide film 75 are used as a hard mask uponetching the interconnection material (W film 71) in the underlayer.

Then, as shown in FIG. 33, first photoresist films 73 a and 73 b havingthe same shape as that of the interconnections are formed over thesilicon oxide film 75, and the silicon oxide film 75 is dry etched usingthe photoresist films 73 a and 73 b as a mask. The distance between thetwo photoresist films 73 a and 73 b is larger than the resolution limitfor the exposure light.

Then, after removing the photoresist films 73 a and 73 b, as shown inFIG. 34, a second photoresist film 74 having the same shape as that ofthe interconnections is formed between the two silicon nitride films 72patterned to have the same shape as that of the interconnections and thesilicon nitride film 72 is patterned to have a shape identical with thatof the interconnections by dry etching using the photoresist film 74 andthe silicon oxide film 75 as a mask. In this case, the distance betweenthe second photoresist film 74 and the silicon oxide film 75 is smallerthan the resolution limit for the exposure light.

Then, when the photoresist film 74 is removed, a first hard mask 76 acomprising a stacked film of the silicon nitride film 72 and the siliconoxide film 75 and a second hard mask 76 b comprising the silicon nitridefilm 72 are formed over the W film 71 as shown in FIG. 35.

Then, as shown in FIG. 36, the W film 71 is dry etched by using the hardmasks 76 a and 76 b as the mask thereby forming plural interconnections71A, 71B, and 71C having a distance between them smaller than theresolution limit for the exposure light. Further, upon dry etching the Wfilm 71 or after dry etching the W film 71, only the silicon nitridefilm 72 can be left over each of the interconnections 71A, 71B, and 71Cby etching the silicon oxide film 75 constituting a portion of the hardmask 76 a. This can facilitate the operation, for example, of formingthrough holes reaching the surface of the interconnections 71A, 71B, and71C by etching the interlayer insulation film over the interconnections71A, 71B, and 71C in the subsequent step.

Preferred Embodiment 3

This embodiment is applied to a method of forming plural contact holeseach at a distance smaller than the resolution limit for the exposurelight to one identical insulating film.

At first, as shown in FIG. 37, after forming n-channel type MISFETs Qnincluding a gate electrode 7 c and an n⁺-semiconductor region 14 over asubstrate 1, a silicon nitride film 19, a silicon oxide film 20, and asilicon nitride film 81 are deposited over the n-channel type MISFET Qn.The silicon nitride film 81 is used as a hard mask upon etching thesilicon oxide film 20 in the lower layer thereof.

Then, as shown in FIG. 38, a first photoresist film 82 is formed overthe silicon nitride film 81, and the silicon nitride film 81 over thegate electrode 7C is dry etched by using the photoresist film 82 as themask. Thus, a hole pattern 81 a having the same shape as that of thecontact hole is formed in the silicon nitride film 81 over the gateelectrode 7C.

Then, after removing the photoresist film 82, a second photoresist film83 is formed over the silicon nitride film 81 and the silicon nitridefilm 81 over the n⁺-semiconductor region 14 is dry etched using thephotoresist film 83 as a mask. Thus, a hole pattern 81 b having the sameshape as that of a contact hole is formed in the silicon nitride film 81over the n⁺-semiconductor region 14 as shown in FIG. 39.

Then, after removing the photoresist film 83, a contact hole 84 isformed in the silicon oxide film 20 over the gate electrode 7C, and acontact hole 85 is formed in the silicon oxide film 20 over then⁺-semiconductor region 14 by dry etching using the silicon nitride film81 formed with the hole patterns 81 a and 81 b as a mask as shown inFIG. 40.

Then, as shown in FIG. 41, the silicon nitride film 81 left on thesilicon oxide film 20, and the silicon nitride film 19 exposed to thebottom of the contact holes 84 and 85 are etched simultaneously, tocomplete the contact holes 84 and 85. Then, as shown in FIG. 42, a plug86 is formed inside the contact holes 84 and 85.

As described above, in this embodiment, in a case of forming the contactholes 84 and 85 in the silicon oxide film 20 using the silicon nitridefilm 81 formed with the hole patterns 81 a and 81 b as a mask, the holepattern 81 a and the hole pattern 81 b are formed separately by twiceetching using the first and the second photoresist films 82 and 83 asthe mask.

Thus, since the distance between the hole pattern 81 a and the holepattern 81 b can be decreased to be smaller than the resolution limitfor the exposure light, the distance between the contact hole 84 overthe gate electrode 7 c and the contact hole 85 over the n⁺-semiconductorregion 14 can be decreased to be smaller than the resolution limit forthe exposure light and the MISFET can be refined.

Preferred Embodiment 4

This embodiment is applied to a method of forming interconnections in amemory hybridized logic device in which a central processing unit (CPU),an analog circuit, an input/output circuit (I/O), and a memory circuit(RAM, ROM) are integrated on the main surface of a semiconductor chip100 for example, as shown in FIG. 43.

At first, as shown in FIG. 44, an n-channel type MISFET Qn (and notillustrated p-channel type MISFET) is formed to a portion of a substrate1 constituting a semiconductor chip 100 (for example, CPU formingregion, memory circuit forming region, analog circuit forming region orinput/output circuit forming region) and, successively, a contact hole102 is formed in a silicon oxide film 101 as an insulating film forcovering the MISFETs, a plug 103 as a conductive film is buried to theinside thereof, and then a conductive film 104 for the first layerinterconnection is deposited over the silicon oxide film 101. Theconductive layer 104 comprises, for example, a three layered film of aTiN film, an Al-alloy film and a TiN film deposited, for example, by asputtering method.

Then, as shown in FIG. 45 (plan view) and FIG. 46 (cross sectional viewtaken along line E-E′ in FIG. 45), the conductive film 104 is patternedby dry etching using a first photoresist film 105 formed over theconductive film 104 as a mask. In this case, as shown in FIG. 45, theconductive film 104 is patterned such that a planar pattern thereofextends in a stripe-shape along a right-to-left direction (direction X)as seen in the drawing.

Lattice-like lines shown by broken lines in FIG. 45 show a pattern inwhich interconnections are disposed for easy understanding of thedrawing. Broken lines extending in the right-to-left direction(direction X) shows channels in which the first layer interconnectionsare formed, and broken lines extending in the upward-to-downwarddirection (direction Y) show channels in which the second layerinterconnections are formed, respectively. That is, the conductive film104 is at first patterned along the extending direction of the firstlayer interconnections (channel direction). Although the invention isnot restricted particularly, the distance S between the channels isequal with respect to both the direction X and the direction Y in thisembodiment.

Then, after removing the photoresist film 105, as shown in FIG. 47 andFIG. 48, the conductive film 104 is patterned by dry etching using, forexample, the second photoresist film 106 as a mask. In this case, theconductive film 104 is patterned in the direction of the channel of thefirst layer interconnections (direction X) and in the directionperpendicular thereto (direction Y), to complete the first layerinterconnections 107 comprising the conductive film 104. The first layerinterconnections 107 can be formed also by patterning the conductivefilm 104 in the direction perpendicular to the channel direction(direction Y) and then patterning the film along the channel direction(direction X).

In the method of forming the first layer interconnections 107 describedabove, since the conductive film 104 is patterned by twice etching usingtwo sheets of photomasks, the effect of interference between theexposure lights can be eliminated. That is, plural conductive films 104are formed by using photolithographic steps several times by usingplural sheets of photoresist masks. As a result, since the roundness onboth ends of the first layer interconnections 107 is decreased, theamount of inward retraction for both ends of the first layerinterconnections 107 can be decreased.

Thus, the width between the end of the first layer interconnections 107and the channel (space=c, shown in FIG. 47) can be decreased in thechannel direction (direction X) for the first layer interconnections.Accordingly, even in a case where the first layer interconnections 107are disposed at the crossing point between adjacent channels, the widthbetween the end of the first layer interconnection 107 and the channel(space=c, shown in FIG. 47) and the space between the first layerinterconnections 107 and 107 (space=a, shown in FIG. 47) can be narrowedin the channel direction of the first layer interconnections (directionX), the distance S between the channels can be decreased in the channeldirection (direction X) of the first layer interconnections to improvethe interconnection density.

As shown in FIG. 49 and FIG. 50, after depositing, for example, asilicon oxide film 108 as an intermediate insulating film over the firstlayer interconnection 107, the surface of the interlayer insulating filmis planarized by polishing such as by a CMP (Chemical MechanicalPolishing) method and then a contact hole 109 is formed in the siliconoxide film 108, and a plug 110 is buried therein. As shown in FIG. 49,the contact hole 109 is disposed at the crossing point between thechannel formed with the first layer interconnection 107 and a channelformed with the second layer interconnection.

Then, as shown in FIG. 51 and FIG. 52, a conductive film for secondlayer interconnections deposited over the silicon oxide film 108 ispatterned by the same method as that used for the conductive film 104,to form second layer interconnections 111, and the second layerinterconnections 111 and the first layer interconnections 107 areconnected electrically by way of the plugs 110 in the contact holes 109.

In the method of forming the second layer interconnections 111 describedabove, since the conductive film is patterned by twice etching using thetwo sheets of photomasks by the same method as that used for theconductive layer 104, the effect caused by the interference between theexposure lights is eliminated. That is, plural conductive films areformed by photolithographic steps plural times by using plural sheets ofphotoresist masks. As a result, since the roundness on both ends of thesecond layer interconnections 111 is decreased, the amount of inwardretraction for both ends of the second layer interconnections 111 can bedecreased. This can reduce the width between the end of the second layerinterconnections 111 and the channel (space=c, shown in FIG. 51) withrespect to the channel direction of the second layer interconnections(direction Y).

As has been described above, according to the method of forminginterconnections in this embodiment, the amount of inward retraction forboth ends of the first layer interconnections can be decreased bypatterning the conductive film 104 for use in interconnections by twiceetching using two sheets of photomasks.

This can reduce the width between the end of the first layerinterconnection 107 and the channel (space=c, shown in FIG. 47) in thechannel direction of the first layer interconnections (direction X).Accordingly, even in a case where the first layer interconnections aredisposed at the crossing point between the adjacent channels, since thewidth between the end of the first layer interconnection 107 and thechannel (space=c, shown in FIG. 47) and the space between the firstlayer interconnections 107 (space=a, shown in FIG. 47) can be narrowed,it is possible to reduce the distance S between the channels in thechannel direction of the first layer interconnections (direction X), toimprove the density of interconnections.

Further, the displacement amount between the end of the first layerinterconnections 107 and the contact hole 109 formed thereover(displacement amount=b, shown in FIG. 51) can be decreased. That is, theamount of inward retraction, and the amount of displacement consideringthe alignment margin and reservoir (displacement amount=b, shown in FIG.51) can be reduced. Accordingly, even in a case where the contact holes109 and 109 are arranged at the crossing points of the channels adjacentwith each other, since the space between the first layerinterconnections 107 (space=a shown in FIG. 51) can be narrowed, it ispossible to reduce the distance S between the channels and improve thedensity of interconnections.

On the other hand, in a case of patterning the conductive film 104 foruse in interconnections by etching for once using a single sheet ofphotomask, the amount of inward retraction for the both ends of thefirst layer interconnections 107 is increased. Accordingly, for reliableconnection between the first layer interconnection 107 and the plug 110in the contact hole 109, since it is necessary to ensure a largedisplacement amount (b) between the end of the first layerinterconnection 107 and the contact hole 109 formed thereover, it isdifficult to reduce the distance S between the channels and improve thedensity of interconnections. That is, the distance S in the channel hasto be made larger and improvement is difficult for the density ofinterconnections.

Further, the amount of inward retraction for both ends of the secondlayer interconnection 111 can be decreased by patterning the conductfilm for use in interconnections by twice etching using two sheets ofphotomasks. This can reduce the width (space=c, in shown in FIG. 51)between the end of the second layer interconnection 111 and the channelin the channel direction (direction Y) of the second layerinterconnections 107. Further, like the first layer interconnections,since the space (space=a, shown in FIG. 51) between the second layerinterconnections 111 can be narrowed, it is possible to reduce the gap Sbetween the channels and improve the density of interconnections.

Further, the amount of inward retraction for both ends of the firstlayer interconnection 107 and the second layer interconnection 111 canbe decreased by patterning the conductive film for use ininterconnections by twice etching using two sheets of photomasks. Thus,since this can narrow the width between the end of the interconnection107 or 111, and the channel (space=c, shown in FIG. 47 and FIG. 51), thespace between the first layer interconnections 107, and the spacebetween the second layer interconnections 111 (space=a, shown in FIG.51), it is possible to decrease the distance S between the channels toimprove the density of interconnections.

Although not illustrated, it will be apparent that the third orsuccessive layer interconnections can also be formed in the same manneras that for the first layer interconnections 107 and the second layerinterconnections 111.

Further, the first layer interconnections 107 (or second layerinterconnections 111) may also be formed by the following method. Atfirst, as shown in FIG. 53, a conductive film 104 is patterned by dryetching using a first photoresist film (not illustrated) as a mask. Inthis case, the conductive film 104 is patterned such that the planarpattern extends in a stripe-like manner along the right-to-leftdirection as seen in the drawings and, for the first layerinterconnections 107 disposed on one identical channel, those portionswith a large space between each other are separated in this step.

Then, as shown in FIG. 54, the conductive film 104 is patterned by dryetching using the second photoresist film (not illustrated) as a mask,and among the first layer interconnections 107 disposed on one identicalchannel, only the portions with a narrow space for each other areseparated to complete first layer interconnections 107. Then, as shownin FIG. 55, contact holes 109 are formed each at the crossing pointbetween the channel formed with the first layer interconnection 107 andthe channel to be formed with the second layer interconnections.

According to the method of forming the interconnections described above,among a plural first layer interconnections 107 arranged on oneidentical channel, the displacement amount of inward retraction for theends thereof can be decreased in the portions where the space betweeneach other is narrow. This can reduce the width between the end of thefirst layer interconnection 107 and the channel (space=c, shown in FIG.47) in the direction of the channel of the first layer interconnections(direction X). Further, since the space (a) between the first layerinterconnections 107 can be narrowed, it is possible to reduce thedistance S between the channels to improve the density ofinterconnections.

Further, since the provability that the contact holes 109 are arrangedon the cross points of the channels adjacent with each other isgenerally low, the amount of data for the pattern formed to the secondsheet of photomask is decreased by the method of forming theinterconnections described above. This can shorten the time required forthe manufacture of the second sheet of photomask.

In a case of patterning the conductive film 104 for use ininterconnections by twice etching using two sheets of photomasks, KrFand ArF (argon fluoride) at a shorter wavelength than that can be usedin combination as an exposure light source. That is, the first layerinterconnections 107 or the second layer interconnections 111 may alsobe formed by patterning only the portions with a large space betweeneach other by a lithographic step using KrF as an exposure light sourceand patterning portions with a narrow space between each other by alithographic step using an ArF as an exposure light source. In thiscase, since it is possible to decrease the amount of use for thephotoresist film for use in ArF of requiring higher cost compared with acase of forming the first layer interconnections 107 or the second layerinterconnections 111 by twice lithographic steps using ArF as theexposure light source, the cost for manufacturing memory hybridizedlogic devices can be reduced.

The first layer interconnections 107 or the second layerinterconnections 111 can also be formed by a method of using a hard masklike that shown in FIG. 20 to FIG. 24. That is, as shown in FIG. 56,like in FIG. 20 to FIG. 24, after at first patterning a hard mask(silicon nitride film 120) by twice etching using two sheets ofphotoresist masks, the photoresist mask is removed and the first layerinterconnections 107 or the second layer interconnections 111 are formedby etching using the hard mask (silicon nitride film 120) as a mask. Asdescribed above, plural hard masks (silicon nitride film 120) are formedby using photolithographic steps for several times using plural sheetsof photoresist masks, and the plural first layer interconnections 107 orsecond layer interconnections 111 are formed by etching using pluralhard masks. As a result, since a thin hard mask is patterned by using aphotoresist mask, the thickness of the photoresist mask film can bedecreased, the fabrication accuracy can be improved, and finerfabrication is possible. More specifically, as shown in FIG. 56, afterdepositing at first a conductive film 104 for use in the firstinterconnections over the silicon oxide film 101 covering MISFET asshown in FIG. 56, a silicon nitride film 120 covering the MISFET isdeposited over the silicon oxide film 101 by a CVD method on theconductive film 104. The silicon nitride film 120 is used as a hard maskfor patterning the conductive film 104. In this case, it will beapparent that the hard mask (silicon nitride film 120) is not restrictedto the silicon nitride film but may be constituted also with an SIONfilm.

Then, as shown in FIG. 57( a) and FIG. 57( b) (cross sectional viewalong line F-F′ in FIG. 57( a)), the silicon nitride film 120 ispatterned by dry etching using a first photoresist film 121 formed overthe silicon nitride film 120 as a mask. In this case, the siliconnitride film 120 is patterned only for the portions with a large spacebetween each other.

Then, after removing the photoresist film 121, as shown in FIG. 58( a)and FIG. 58( b), the silicon nitride film 120 is patterned by dryetching using a second photoresist film 122 as a mask. In this case, thesilicon nitride film 120 is patterned for the portions with a narrowspace between each other.

As described above, by patterning the silicon nitride film 120 by twiceetching using the two sheets of photomasks, the portions with a narrowspace between each other can be isolated at a good accuracy.

Then, after removing the photoresist film 122, as shown in FIG. 59( a)and FIG. 59( b), the conductive film 105 is patterned by dry etchingusing the silicon nitride film 120 as a mask to complete first layerinterconnections 107. Then, as shown in FIG. 60, plural contact holes109 are formed at the ends of the first layer interconnections 107.

According to the method of forming the interconnections described above,since the silicon nitride film 120 having a higher etching selectivityto the conductive film 104 compared with the photoresist film is usedfor the mask, the first layer interconnections 107 can be patterned at ahigher accuracy. This can reduce the space between the ends of the firstlayer interconnections 107 adjacent to each other and dispose the pluralcontact holes 109 to the ends of the first layer interconnections 107 ata high density.

The method of forming the interconnections in this embodiment, asdescribed above, is also applicable, for example, as shown in FIG. 61,to a case of forming the first layer interconnections 107 by a damascenemethod. Also in this case, since the space between the first layerinterconnections 107 to each other can be narrowed by forming the firstlayer interconnections 107 by twice etching using the two sheets ofphotomasks, it is possible to reduce the distance between the channelsand improve the density of interconnections.

According to the method of forming the interconnections in thisembodiment, as described above, plural conductive films are formed byusing photolithographic steps several times using plural sheets ofphotoresist masks.

Further, plural hard masks (silicon nitride film 120) are formed byusing photolithographic steps plural times by using plural sheets ofphotoresist masks, and the plural first layer interconnections 107 orsecond layer interconnections 111 are formed by etching using the pluralhard masks.

Further, plural interconnection patterns each in the shape of a straightpattern are formed from the conductive film by using thephotolithographic step using the photoresist mask film for use in KrF,and plural interconnection patterns adjacent with each other are formedby using a photolithographic step using the photoresist mask film foruse in ArF from the plural interconnection patterns each in the straightpattern. It will be apparent that the order may be replaced between thestep of forming the interconnection pattern using the photolithographicsteps by using the photoresist film for use in KrF and the step offorming the interconnection pattern using the photolithographic step byusing the photoresist film for use in ArF.

The present invention has been described specifically with reference tothe preferred embodiments but it will be apparent that the invention isnot restricted to the embodiments described above but can be modifiedvariously within a scope not departing the gist thereof.

For example, the memory cell of the SRAM shown in the PreferredEmbodiments 1 to 3 may be used as a memory for the memory hybridizedlogic device shown in the Preferred Embodiment 4. Further, logiccircuits such as a CPU may also be constituted with the peripheralcircuit of the SRAM shown in the Preferred Embodiments 1 to 3. Further,the memory hybridized logic device shown in the Preferred Embodiment 4may be constituted with a single logic device or a single memory.Further, the method of forming the interconnections shown in thePreferred Embodiment 4 is applicable also to the memory cell of the SRAMand the peripheral circuit thereof shown in the Preferred Embodiments 1to 3.

Advantageous effects obtained by typical embodiments among thosepreferred embodiments disclosed in the present application are simplydescribed below.

Since the distance between each of plurality intermediate conductivelayers formed in one identical interconnection layer within an identicalmemory cell can be reduced to be smaller than the resolution limit forexposure light, interconnection or memory cell size can be decreased.

Further, the memory cell size for the SRAM can be decreased to promoteincrease in integration degree.

Further, refinement and higher degree integration for LSI can bepromoted by reducing the distance between plurality interconnectionsformed in one identical interconnection layer or the distance betweeneach of plural through holes formed in one identical insulating filmover a semiconductor substrate.

Advantageous effects obtained by typical aspects of the invention amongthose disclosed in the present application are simply described below.

Increase in the integration degree for the semiconductor circuit devicecan be promoted.

1. A method of manufacturing a semiconductor integrated circuit device,comprising steps of: providing a semiconductor substrate, thesemiconductor substrate including semiconductor elements and a firstinsulating film formed over the semiconductor elements: forming a firstlayer over the first insulating film; forming first masks over the firstlayer and at first portions of the first layer; forming a second maskover the first layer and at a second portion of the first layer suchthat the second mask is formed with a different layer from the firstmasks, wherein the second portion of the first layer is arranged betweenthe first portions of the first layer such that the second mask and thefirst masks are separately formed with each other; and removing thefirst layer by using the first masks and the second mask as a mask so asto form a pattern for wiring lines.
 2. A method according to claim 1,wherein the first layer is comprised of a conductive material.
 3. Amethod according to claim 1, wherein the second mask is comprised of adifferent insulating material from the first masks.
 4. A methodaccording to claim 1, wherein the first masks and the second mask serveas a hard mask in the step of removing the first layer.
 5. A methodaccording to claim 1, wherein distances between the second mask and thefirst masks are smaller than the resolution limit for the exposurelight.
 6. A method of manufacturing a semiconductor integrated circuitdevice, comprising steps of: providing a semiconductor substrate, thesemiconductor substrate including semiconductor elements and a firstinsulating film formed over the semiconductor elements: forming a firstlayer over a first insulating film formed over a semiconductor substratewith semiconductor elements and with a first insulating film formed overthe semiconductor elements; forming first masks over the first layer andat first portions of the first layer; forming a second mask over thefirst layer and at a second portion of the first layer such that thesecond mask is formed with a different layer from the first masks andsuch that the second portion of the first layer is arranged between thefirst portions of the first layer, wherein the second mask and the firstmasks are separately formed with each other; and removing the firstlayer by using the first masks and the second mask as a mask so as toform a pattern of the first layer.
 7. A method according to claim 6,wherein the first layer is comprised of a conductive material.
 8. Amethod according to claim 6, wherein the second mask is comprised of adifferent insulating material from the first masks.
 9. A methodaccording to claim 6, wherein the first masks and the second mask serveas a hard mask in the step of removing the first layer.
 10. A methodaccording to claim 6, wherein distances between the second mask and thefirst masks are smaller than the resolution limit for the exposurelight.